Cleanliness inspection system provides all-in-one scan

Olympus has launched the CIX90 technical cleanliness control system. It provides cleanliness inspection with an intuitive interface that provides step-by-step guidance to users.

The dedicated turnkey system is optimized for fast, accurate, and reproducible particle detection that delivers classification and reporting in accordance with international cleanliness standards, says the company. A patented polarization method detects both reflective and nonreflective particles in a single scan.

Features include reproducible observation conditions and high image quality, integrated calibration and maintenance tools, and live processing of contaminant particles from 2.5 µm to 1.65 in. Image stitching automatically reconstructs images of large particles.