Optical width gauge designed for strip measurements

June 30, 2014

IMS Systems Inc. has developed an optical width gauge for measuring edge crack, hole/pinhole, and strip contour defects in cold processing environments. The compact, lightweight IMS Camera Cluster Systems (CCS) gauge features an air or water blowoff system for harsh environments, as well as the ability to monitor for dirt and remain unaffected by ambient light.

The gauge weighs just over 300 lbs., compared to the previous generation model’s weight of nearly 1 ton. It measures strip or sheet of any thickness and is accurate to within 0.004 in. in environments with ambient temperatures up to 120 degrees F. The gauge can be adapted to production lines handling aluminum and tin plate packaging materials. It can perform inspection, recoiling, cut-to-length, slitting, coating, and foil separation.