Bowman’s P series XRF coating measurement system measures variety of product sizes

Bowman has introduced the P series benchtop XRF coating measurement system. It identifies elements in each of up to five coating layers quickly and precisely, the company states.

Standard system configurations include a four-position collimator assembly, variable-focus camera for applications with recessed areas, extended-life micro-focus X-ray tube, and a solid-state PIN detector. The detector has well-defined element peaks, eliminating the need for secondary filters. Minimal peak position drift helps ensure stability over time and extends the interval between recalibrations. An SDD detector also is available.

According to the company, the proximity of the X-ray tube to the detector produces more than three times the photon counts of conventional XRF equipment in a shorter measurement time.