Laser confocal scanning microscope measures at submicron level

The new Olympus LEXT® OLS5000 3-D laser confocal scanning microscope delivers precise imaging for R&D and QC inspection in the automotive, electronic component, and semiconductor industries.

4K scanning technology and optics enable the detection of near-perpendicular features and small steps at close to nano-scale. It acquires data quickly, and the intuitive software is designed to automate many common settings.

An expansion frame and a dedicated, long working distance lens perform precise measurements on samples up to 8.27 in. tall and concavities up to 0.98 in. deep—even those with uneven surface cracks. The result is noncontact, 3-D measurement of a variety of samples.