Olympus CIX100 cleanliness inspection system can be used as a digital microscope

The Olympus CIX100 cleanliness inspection system’s latest software update includes a new microscope mode, providing component manufacturers with an all-in-one imaging tool for particle analysis and microscope inspections.

The turnkey system is dedicated to technical cleanliness inspection with a guided work flow, analysis tools, and integrated industry standards. An autofocus routine and optional overview scan in CIX software version 1.5 speed up the automated analysis. The new microscopy mode enables users to leave the dedicated cleanliness inspection work flow to perform microscopic imaging for other applications.

Microscope mode capabilities can be expanded with optional material analysis tools—from interactive microscopy and layer thickness measurement in surface coatings to the automatic evaluation of grain sizes—enabling users to customize the system for their needs.