Vanta iX inline XRF analyzer from Olympus automates material analysis
The new Vanta iX inline X-ray fluorescence (XRF) analyzer from Olympus automates material analysis and alloy ID on the manufacturing line, delivering instant results for real-time process monitoring and 100% inspection.
Designed to operate 24/7, the analyzer provides material and grade ID in seconds. It delivers pass/fail results or full material chemistry. With a silicon drift detector and the company’s Axon Technology, the analyzer can test a variety of alloy and metal grades.
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